Abstract
In this work we present the preparation and characterization of cerium doped lanthanum zirconate (LCZO) films and non-stoichiometric lanthanum zirconate (LZO) buffer layers on metallic Ni-5% W substrates using chemical solution deposition (CSD), starting from aqueous precursor solutions. La2Zr2O7 films doped with varying percentages of Ce at constant La concentration (La0.5CexZr1−xOy) were prepared as well as non-stoichiometric La0.5+xZr0.5−xOy buffer layers with different percentages of La and Zr ratios. The variation in the composition of these thin films enables the creation of novel buffer layers with tailored lattice parameters. This leads to different lattice mismatches with the YBa2Cu3O7−x (YBCO) superconducting layer on top and with the buffer layers or substrate underneath. This possibility of minimized lattice mismatch should allow the use of one single buffer layer instead of the current complicated buffer architectures such as Ni-(5% W)/LZO/LZO/CeO2. Here, single, crack-free LCZO and non-stoichiometric LZO layers with thicknesses of up to 140 nm could be obtained in one single CSD step. The crystallinity and microstructure of these layers were studied by XRD, and SEM and the effective buffer layer action was studied using XPS depth profiling.
Highlights
Chemical solution deposition (CSD) has been used as an important and cost-effective method for the deposition of YBa2Cu3O7−x (YBCO) based second generation superconductors
This indicates that the larger Ce4+ ions are successfully doped into the lanthanum zirconate (LZO) lattice, leading to an increase of the lattice parameter of the LCZO buffer layers, as can be expected from the larger ionic radius of Ce4+ (101 pm) compared to Zr4+ (86 pm)
(La0.50Ce1−xZr0.50−xOy) and the non-stoichiometric LZO lanthanum zirconium oxide (La0.5+xZr0.5−xOy) buffer layers as well as the shift in lattice parameter that was observed for these doped layers with varying stoichiometries
Summary
Chemical solution deposition (CSD) has been used as an important and cost-effective method for the deposition of YBa2Cu3O7−x (YBCO) based second generation superconductors. YBCO films for superconducting applications must be deposited on flexible, Rolling Assisted. The high temperature processing of YBCO layers (≥500 nm thickness), in an oxygen atmosphere can lead to the oxidation of the Ni-5% W substrate and penetration of Ni atoms from the substrate into the superconducting layer. In the event of such chemical interactions, the performance of the coated conductor will strongly decrease. Buffer layers are absolutely necessary for coated conductor designs. Many buffer layers, including lanthanum zirconate (LZO) [2,3,4,5,6], cerium oxide (CeO2) [7,8,9,10]
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