Abstract
The possibilities of the PIXE method in combination with the RBS method in the analysis of the high- c superconducting thin films are discussed. The results obtained applying 4He ions with energies up to 3.1 MeV in the bombardment of YBaCuO layers on selected substrata are presented. The heavy element concentrations are determined by the PIXE method using the yields of K α for Cu as well as Y and L α for Ba. The quantitative analysis based on fundamental parameters as well as external standards have been applied. The content of heavy elements can be determined with an accuracy of about 2–3 rel.%. The oxygen content was determined using 3.045 MeV resonance in 16O( 4He, 4He) 16O elastic scattering with an accuracy of even 1 rel.%. The RBS method was used to determine the layer thickness as well as the chemical composition. Finally, the comparison with ICP-AES, XRF and AAS methods is given.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
