Abstract
One aspect of high voltage electron microscopy, which is normally considered to be a disadvantage in the usual materials studies, is the production of atomic displacements or radiation damage in the specimen. This imposes limitations on beam current, accelerating voltage used or time of observation if one is concerned with measurements which are sensitive to the presence of point defects. This limiting aspect can be turned into a major asset, however, in the case of investigations involving the study of irradiation effects in metals and alloys. The HVEM has a special advantage in such studies, since it makes possible the continuous observation of the accumulation of crystal defects during the process of irradiation.
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