Abstract
IntroductionWe have used a Philips EM400 electron microscope with a STEM pole- piece to carry out convergent beam electron microscopy on a wide variety of materials, including precipitates in stainless steels, metal/semiconductor contacts, metal oxide catalysts, environmental fibres, metastable phases in evaporated films, and transition metal chalcogenide layer compounds. Two features of this microscope make it particularly suitable for convergent beam work. These are its low hydrocarbon partial pressure which greatly reduces the carbon contamination of the specimen when working with a small probe (̴ 300 Ådiameter) and the very wide angular field of view in the diffraction plane (̴ 16°).Two-dimensional diffraction may be used to yield information about the projected crystal potential. In certain cases a simple relationship has been established between the form of zone axis patterns and the nature of the projected potential, Oneway of using this information is by making measurements of zone axis critical voltages and we have recently extended our measurements to a number of zone axis patterns with 6 mm symmetry having different sorts of projected potential.
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