Abstract
The dependence of the forward operating voltage of In1−xGaxN/GaN light-emitting diodes (LEDs) on Mg flow rate during the growth of the p-GaN layer has been investigated. The hole concentration in the p-GaN layer increases with Mg flow rate up to a critical value and gradually decreases for higher flow rates. We find that the forward threshold voltage of the LEDs mainly depends on the Mg concentration in the p-GaN layer and is rather independent of hole concentration. A current flow mechanism involving the impurity acceptor band, instead of the usual valence band, is proposed to elucidate this anomalous behaviour of the I–V characteristics.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
