Abstract
ABSTRACTIntriguing properties exhibited by nanocrystalline metals, including a high level of mechanical strength, arise from their nanometer-scale grain sizes. It is critical to determine the evolution of grain size of nanocrystalline materials at elevated temperature, as this process can drastically change the mechanical properties. In this work, a nanocrystalline Ni foil with grain size ∼ 25 nm was annealed in situ in an X-ray diffractometer. X-ray diffraction peaks were analysed to determine the grain growth kinetics. The grain growth exponents obtained were ∼ 2–4 depending upon the crystallographic direction, indicating the anisotropic nature of the grain growth kinetics.
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