Abstract
Geza I. Mark,1,2,* Peter Vancso,1,2 Chanyong Hwang,2,3 Philippe Lambin,4 and Laszlo P. Biro1,2 1Research Institute for Technical Physics and Materials Science, H-1525 Budapest, P.O. Box 49, Hungary 2Korean-Hungarian Joint Laboratory for Nanosciences, H-1525 Budapest, P.O. Box 49, Hungary 3Center for Advanced Instrumentation, Division of Industrial Metrology, Korea Research Institute of Standards and Science, Yuseong, Daejeon 305-340, Republic of Korea 4Department of Physics of Matter and Radiations, University of Namur FUNDP, 61, Rue de Bruxelles, B-5000 Namur, Belgium (Received 20 November 2011; revised manuscript received 28 January 2012; published 30 March 2012)
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