Abstract
The angular dependence of magnetic field on the critical current density(Jc) has been investigated for a polycrystalline Tl2Ba2Ca2Cu3Ox(2223) thin film which was prepared on a MgO(100) substrate using excimer laser ablation and post-annealing. The film was composed entirely of the 2223 phase and had a highly c-axis oriented structure. The film showed Jc of 1.5×105A/cm2, which correspond to 9.8A, in zero magnetic field at 77K. A drastic decrease in Jc was observed under magnetic fields with increasing angle between the film plane and the magnetic field. When this angle was equal to 0 and 90 degrees with B ⊥ I, the Jc was 1.3×105A/cm2(1T) and 1.3X103A/cm2(0.7T), respectively. Magnetic field dependence on Jc was formulated as a function of perpendicular component of the magnetic field to the a-b plane.
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