Abstract
Experimental observation of angular speckle correlations for two-dimensional nano-rough silica layers on silicon substrate are presented. The set-up makes use of a digital CCD camera to record the speckle patterns as a function of illumination and scattering angular conditions. C(1) correlations corresponding to the optical memory and time-reverse memory effects are reported for three different samples. C(10) correlation does not presently seem to be observable. (© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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