Abstract
Short time carrier dynamics of time resolved photoluminescence (TR-PL) decays and time resolved fluorescence imaging (TR-FLIM) acquisitions contain valuable information on the optoelectronic properties of photovoltaic materials. We performed a theoretical analysis on drift diffusion models to provide a scaling law for the time derivative of the transient photoluminescence signal as a function of both laser excitation power and wavelength. This innovative approach allowed us to design a new interpretation method for transient photoluminescence data. With this method, we extract the external radiative recombination rate without fitting complex drift diffusion models. We tested this scaling on state-of-the-art triple cation mixed halide perovskite absorbers. We discussed the validity of this method and its applicability on imaging data. Moreover, by coupling this analysis with longer decay fitted with classical drift-diffusion model we obtained a coherent model for the triple cation lead halide perovskite under study.
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