Abstract
This paper presents a numerical analysis and experiment to investigate a contact resistivity distribution of a no-insulation (NI) high-temperature superconductor (HTS) racetrack coil. Since the racetrack coil consists of straight and curved sections with continuously varing curvatures, the local inhomogeneity of contact resistivity can occur. We adopt a partial element equivalent circuit (PEEC) method to investigate this inhomogeneity. A 50-turn NI HTS single pancake test coil is fabricated to figure out the discrepancy of contact resistivity, and the coil is charged up to 100 A in a liquid nitrogen bath. Voltage profiles between inserted voltage taps and the magnetic fields at the coil center are measured and compared with two simulation cases: 1) uniform contact resistivity; 2) nonuniform contact resistivity distribution. The results indicated that nonuniform distribution of contact resistivity may exist. Lastly, the current and Joule heat distribution during the ramping process is analyzed by the PEEC model.
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