Abstract
A technique for measurement of rare earth element (REE) concentrations in silicates using a Camecaims-4f ion microprobe and doubly-charged, odd-mass isotopes has been developed. The secondary ion spectra of the doubly-charged odd-mass REE are virtually free of interferences, allowing measurements to be carried out at low energies and without the need for spectral stripping. Calibration lines have been established for La, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Er, Tm, and Yb using a suite of clinopyroxene standards. This technique offers a relatively fast, simple approach for the in-situ analysis of REE on spots of <20 [mu]m and detection limits of <15 ppb for most elements. 17 refs., 2 figs., 5 tabs.
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