Abstract
Accurate measurement of external quantum efficiency(EQE) of cells embedded in PV modules is critical for reducing the uncertainty of the flash I-V measurements during secondary calibration of PV modules. This paper presents detailed analysis and quantification of possible sources of errors due to various factors such as shading of target cell, load point determination, variance in cell-to-cell electrical properties and use of AC probe light. Moreover, the technique is also extended for measuring EQE of cells in the degraded modules by changing different cell parameters, thus enabling use of this technique for non-destructive failure analysis. Separate analysis for biasing the module with a programmable load and a four-quadrant power supply is presented. Appropriate correction factors are obtained for accurate load point determination for the two cases with less than 3 % error in the absolute EQE.
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