Abstract
An experimental laboratory set-up suitable for the processing of undercooledmillimetre size liquid droplets supported on inert substrates is described.The apparatus is composed of a high-vacuum chamber and a pyrometricprobe with a small area sensitivity. The acquisition-control system, basedon a PC with an ADC board, is able to perform repeatedly automaticheating–cooling temperature cycles in which the sample is melted andundercooled. The sample thermal history is acquired during the free radiationcooling phase and the eventual sudden temperature rise associated withcrystallization (recalescence) is recorded. A novel approach to determine thenucleation rate of an undercooled liquid from a wide statistical ensembleof recalescence temperatures is proposed. Preliminary results obtainedon high purity Ge samples supported on BN substrates are reported.
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