Abstract
A 1 Ci Pu−Be neutron source and a low-background beta-spectrometer were used to activate and to measure the beta-rays of low-activity. The main characteristics of this method can be given as follow: The determined S/N ratio increases because the background beta-rays are lower than the gamma-rays. For example, the sensitivity obtained for quantitative analysis of sulphur in silicon is 100 ppm in case of S/N=1.0.
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