Abstract
This work will show the results of Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy on thin films of ZrO2:16%Y and CeO2, (with a particle size ranging from 4 nm to 330 nm), prepared on a sapphire substrate. The EXAFS measurements will reflect the true nature of the ZrO2 and CeO2 nanocrystallites and will enable meaningful conclusions to be drawn about the levels of disorder at the atomic level.
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