An Analytical Technique to Extract Surface Information of Negatively Stained or Heavy-Metal Shadowed Organic Materials within the TEM

Abstract

Using a series of uranyl acetate stained or platinum-palladium shadowed organic samples, an empirical analytical method to extract surface information from energy-filtered transmission electron microscopy (EFTEM) images is described. The distribution of uranium or platinum-palladium atoms, which replicate the sample surface topography, have been mathematically extracted by dividing the image acquired in the valence bulk plasmon energy region (between 20 and 30 eV) by the image acquired at the carbon K ionization edge (between 284 and 300 eV). The resulting plasmon-to-carbon ratio (PCR) image may be interpreted as a precise metal replica of the sample surface. In contrast to conventional EFTEM elemental mapping, including an absolute quantification approach, this technique can be applied to 200-600 nm thick organic samples. A combination of conventional TEM and PCR imaging allows one to detect complementary transmission and topographical information with nanometer precision of the same area of carbon-based samples. The advantages and limitations of PCR imaging are highlighted.