Abstract

Using a transfer equation approach, it is shown that the cavity-trapped amplified luminescence (AL) flux densities S integrated over the frequency and cavity length at the threshold of ZnSe, zinc-blende and wurtzite GaN laser diodes (LDs) with stripe-geometry bulk active layers reach (3.5–9)×104 MW/m2 within the temperature range 200–400 K. At these values of S, the nonlinear optical effects induced by AL can be observed. The AL induced recombination can enhance the threshold current density of the short wavelength LDs by two or even three times.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.