Abstract
We show how to improve microfocus X-ray radiography by using the SOPHIAS silicon-on-insulator pixel detector in conjunction with an amplitude grating. Single-exposure multi-energy absorption and differential phase contrast imaging was performed using the single amplitude grating method. The sensitivity in differential phase contrast imaging in a two-pixel-pitch setup was enhanced by 39% in comparison with the previously reported method [Rev. Sci. Instrum. 81, 113702 (2010).] by analyzing charge-sharing effects. Small-angle-scattering imaging was also possible in the two-pixel-pitch setup by counting the number of X-ray photons passing the pixel boundaries.
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