Abstract
We discuss experiments performed with an atomic force microscope that has been modified so that an electric field can be applied across a dielectric particle attached to a cantilever. The modified microscope is used to measure the attractive (before contact) and adhesion (after contact) forces for micrometer-sized dielectric particles. From these measurements, the relative contributions of the nonelectrostatic forces and the electrostatic forces to adhesion can be quantified. Surface conductivity is observed to change the particle's attraction to the surface. In large electric fields, the electrostatic forces dominate the particle's adhesion.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
