Abstract

Aluminum electrolytic capacitors (AECs) and power semiconductor devices (PSDs) are typically identified as weak links in the reliable design of power converters. To eliminate the AECs from the design, active power decoupling (APD) circuits are preferred in single-phase power converters. However, in an attempt to eliminate AECs, this approach introduces the latter weak link in the design, i.e., PSDs in the APD circuit. This article proposes an active thermal control technique to improve the reliability of PSDs in the buck APD circuit. The proposed technique reduces the swing in junction temperature of PSDs using noninvasive power loss modulation. The power loss in PSDs is changed by varying the average voltage across the buffer capacitor. Further, a control technique is suggested to synthesize the reference for average voltage across buffer capacitor. This controller accounts for nonlinearities and minimum/maximum limits of power loss modulation. Further, the additional energy loss due to power loss modulation is restricted to a predefined limit. The proposed technique is validated with the help of circuit simulations and experimental studies with a 500 W laboratory prototype. For the selected mission profile, an increase of 28.5% in the lifetime of PSDs in buck APD circuit is estimated.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.