Abstract
Gd2O2S:Tb phosphors with different terbium content are prepared in a reducing atmosphere at various synthesis conditions. The effect of an activator and Na4P2O7 flux concentrations upon photo-and X-ray induced luminescence of the synthesized samples as well as on their acid-base properties and morphology is studied. The addition of Na4P2O7 flux into the charge mixture leads to a significant increase of the phosphor particle size. A positive correlation is found between the particle size and pH value of the phosphor aqueous slurry. The photoluminescence intensity is found to mostly depend on the activator concentration, while X-ray luminescence intensity primarily depends on the particle size and crystal structure perfectness of the phosphor matrix. Charge mixture compositions and synthesis conditions providing Gd2O2S:Tb phosphors with the highest photo-and X-ray luminescence intensity are determined. A Gd2O2S:Tb phosphor with X-ray luminescence intensity exceeding the values for the commercial phosphor KEP-45 of a similar composition is developed. The obtained phosphors can be used for the manufacture of intensifying screens applied in industrial X-ray flaw detection.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
