Abstract
The development of attribute sampling plans to meet individual users' requirements (as specified by AQL and LTPD values) is conceptually easy to do. However, the mechanics of the procedure can involve excessive computation or table look-ups. These tasks are easily delegated to a micro-computer. In addition, the powerful graphics routines available on TRS-80 and APPLE computers can lend considerable perspective to the problem of choosing an acceptable sampling plan by displaying the entire operating characteristic curves of candidate plans. This paper discusses the use of micro-computers and computer graphics in the design of single and double attribute sampling plans. A program written in BASIC for the Apple III micro-computer is detailed and its capabilities illustrated by an example.
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