Abstract
AbstractA new technique for reliability and quality optimization of electronic components and assemblies, the so called in situ accelerated ageing technique with electrical testing, is presented. This technique is extremely useful for the building‐in approach to quality and reliability. First, it can be used to optimize an electronic component or assembly with respect to its quality and reliability performance at a very early stage, i.e. at the design level, at the level of materials selection, and at the level of identifying production techniques and defining production parameters. The typical test time is of the order of 24 hours, which is sufficiently short to allow a design of experiments type approach to quality and reliability optimization. Furthermore, the technique is also very useful for obtaining a deeper understanding of the physico‐chemical processes which lead to failure. A number of practical examples where the technique has been successfully applied are discussed.
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