Absolute thickness field measurement on curved axisymmetric thin free films with monochromatic light

Abstract

The thickness of thin films is a key parameter to understand their thinning dynamics and stability. Thickness measurements are commonly performed using interferometry. White light illumination allows us to measure the absolute thickness, but is limited to small thicknesses (<2μm) or is restricted to a point with a spectrometer. Monochromatic light gives access to a broader range of thicknesses but solely in a relative manner unless a reference thickness is known. These methods are extensively used to quantify the thickness profiles of flat soap films. In contrast, they are applied to curved interfaces (bubbles) only in a few specific cases, mainly due to the complexity arising from the curvature as the optical path depends on the position. In this paper, we elucidate the influence of the curvature and show that it can be used to measure the entire and absolute thickness profiles using monochromatic light. We demonstrate the validity of the method on soap bubbles, antibubbles, and catenoid soap films. This cost-effective technique is adapted to quantitatively study the thin film dynamics in these geometries.