Abstract
In generally accepted emittance measurement, main attention is concentrated on emittance areas ɛ(x), ɛ(y) occupied by desired part of ion beam in transverse phase space and shape of these areas. The absolute beam phase density (brightness) as usually is not measured directly and the average beam brightness B is calculated from a beam intensity I and the transverse emittances. In the ion source and low energy beam transport (LEBT) optimization, it is important to preserve the beam brightness because some aberration of ion optic and beam instabilities can decrease the brightness of the central part of ion beam significantly. For these brightness measurements, it is convenient to use an absolute beam brightness detector with the brightness determination from one short considered in this article.
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