Abstract

The fact that the inverse localization length is normally distributed in disordered onedimensional systems, combined with the delocalizing effects of inelastic scattering, imply that the resistance of thin metallic wires will be a well-behaved random variable in any temperature regime which appears to be accessible by present experimental techniques. In particular, it is shown that the exponentially large fluctuations in the zero-temperature dc resistance found in studies of the Landauer formula can only be of importance in the exponential hopping regime. A condition for these fluctuations to be observed is derived.

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