Abstract
A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measurement standards and fixture are designed based on these two calibration methods. For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured. The parasitic effects of the SMD capacitors are analyzed. The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components.
Highlights
With the development of electronic technology, SMD components have been widely used in the design of microwave circuits and wireless communication systems
For conventional SOLT (Short-Open-Load-Thru) calibration method, with the increase of the operating frequency, the parasitic effects caused by the calibration standards increase, especially by the fringing capacitance of the open standard
For TRL (Thru-Reflect-Line) calibration method, the calibration bandwidth is limited by the line standard due to the line phase ambiguity, where the eigenvalue matrix becomes unitary and can cause measurement inaccuracy, if only one LINE is used [1, 2]
Summary
With the development of electronic technology, SMD components have been widely used in the design of microwave circuits and wireless communication systems. TRM (Thru-Reflect-Match) calibration is introduced at low frequency range to avoid phase ambiguity. The reflect standards (opencircuited or short-circuited) are connected to the measurement ports. The measured values for reflect standard are e10e01ΓR 1 − e11ΓR
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