Abstract
This research explores the automated detection of surface defects that fall across two different background textures in a light-emitting diode (LED) chip. Water-drop defects, commonly found on chip surface, impair the appearance of LEDs as well as their functionality and security. Automated inspection of a water-drop defect is difficult because the defect has a semi-opaque appearance and a low intensity contrast with the rough exterior of the LED chip. Moreover, the blemish may fall across two different background textures, which further increases the difficulties of defect detection. We first use the one-level Haar wavelet transform to decompose a chip image and extract four wavelet characteristics. Then, the Multi-Layer Perceptron (MLP) neural network with back-propagation (BPN) algorithm is applied to integrate the multiple wavelet characteristics. Finally, the wavelet-based neural network approach judges the existence of water-drop defects. Experimental results show that the proposed method achieves an above 96.8% detection rate and a below 4.8% false alarm rate.
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