Abstract
The systematics of second-order reflections in dielectric time-domain reflectometry are studied with emphasis on the relation between the dielectric relaxation time and the waveform characteristics (fall time and appearance time). A procedure is presented for determining the relaxation time from the characteristics, and has been successfully applied to several Debye-type dielectric substances, whose relaxation times span the range 3–150 ps, the lower of these two times being shorter than the rise time of the incident step voltage from the step generator.
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