Abstract
An analytical model of helium-induced fuzz growth on heated tungsten (Patino et al., 2023) is expanded to include the effects of material exposure temperature via an Arrhenius relation and helium-induced sputtering. The expanded model is able to replicate experimental measurements of fuzz thickness for a range of helium fluences from 0.7–110×1026 m−2, sample temperatures from 993–1300 K, and ion energies from 50–500 eV.
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