A Test Point Selection Method Based on Circuit Topology Graph

Abstract

To the question of test point selection in test or diagnosis for complex electronic equipments and large scale circuit, a test point selection method based on circuit topology and correlation modeling is proposed. This method, firstly, established the topology model based on circuit function structure, then the adjacency matrix of module connection relationship in reaction model and get the initial point set; secondly established correlation modeling using adjacency matrix; then, traversal correlation matrix and delete redundant test point based on reverse deletion strategy, obtain optimal test set; at last, verify this method with a example. Keywords—circuit; topology structure; test point; correlation matrix; optimal test set.