Abstract
Atomic force microscopy (AFM) has been used to measure Poisson’s ratio of ultrathin polymeric films used as substrates in magnetic tapes. A technique has been developed to measure the longitudinal and lateral displacements under uniaxial loading of the films on a microscale. Uniaxial tension is applied by means of a tensile stage. Surface height profiles obtained from the AFM images of unstretched and stretched samples are used to monitor the changes in displacements of the polymer samples in the longitudinal and lateral directions simultaneously. Standard polyethylene terephthalate, tensilized polyethylene terephthalate, and tensilized polyethylene naphthalate films are used to demonstrate the technique.
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