Abstract
A technique is described by which the thickness of TEM foils may be measured. The technique requires the top and bottom foil surfaces to be intersected by precipitates, or some other visible defect such as stacking faults or slip traces, on the {111} matrix planes. This technique requires no assumptions to be made regarding the angle between the normal to the foil surface and the electron beam direction, a parameter that had to be considered in previous methods.
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