A Summary of Low-angle X-ray Atomic Scattering Factors Measured by the Critical Voltage Effect in High Energy Electron Diffraction

Abstract

A summary of all the accurate (-0.1%) low-angle X-ray atomic scattering (form) factors for cubic and hexagonal close-packed elements which have been determined by the critical voltage technique in high energy electron diffraction (HEED) is presented. For low atomic number elements (Z ~ 40) the low-angle form factors can be significantly different to best free atom values, and so the best band structure calculated and/or X-ray measured form factors consistent with the critical voltage measurements are also indicated. At intermediate atomic numbers (Z:::: 40-50) only the very low-angle form factors appear to be different to the best free atom values, and even then only by small amounts. For heavy elements (Z ~ 70) the best free atom form factors appear to agree very closely with the critical voltage measured values and so, in this case, critical voltage measurements allow accurate determinations of Debye-Waller factors.