Abstract
A semi-theoretical relationship is presented between the breakdown voltage of the field plate edge and the field plate design in terms of the finite length and the thickness for a planar P–N junction in this brief for the first time. As the effect of the oxide thickness of the field plate on the breakdown voltage is similar to the junction radius of the planar P–N junction, the effect of the field plate length is just similar to the lateral radius of the planar junction. From this analysis, a simple closed form solution suitable for calculating the breakdown voltage of the field plate edge has been obtained and the theoretical prediction is well verified by the previous experimental data and our numerical simulation results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
