Abstract
Electromagnetic radiated emissions from antennas, printed circuit boards (PCBs), and electronic devices are becoming increasingly critical to today’s IC electromagnetic compatibility and interference properties. In this paper, a rigorous characterization approach is proposed. The electromagnetic field sampling over a spherical testing surface is applied to obtain the radiated magnetic field of the device under test (DUT) placed at the center of the sampling region. Using the dyadic Green’s function (DGF) and Huygens’ principle, the transformation from the sampled spherical tangential field to the far field is directly computed without resorting to the conventional inverse algorithm. The DGF considers the existence of the perfect magnetic conductor sphere and can be represented by a series of spherical wave functions based on the Ohm–Rayleigh method and the scattering superposition technique. For the DUT placed on the infinite perfect electric conducting plane, only hemispherical field scanning is needed based on the image theory. To prove the validity and accuracy of the proposed approach, the electric far-field of Hertzian dipoles, microstrip patch antennas, and PCBs are benchmarked at the end of this paper.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Electromagnetic Compatibility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
