Abstract
A technique has been designed to determine the relative permittivity and dielectric loss of low loss materials using a cylindrical cavity resonator at X band. This technique has been tested over some standard materials with satisfactory results compared to some existing standard methods for measuring tanS. The measurements are performed TE111 mode with the aid of Agilent E4418B EPM series power meter and Agilent 53150A 20 GHz frequency counter.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Microwave Power and Electromagnetic Energy
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
