A novel modification to backpropagation sample selection strategy

Abstract

Random sample selection method in backpropagation results in convergence on the error (root of mean squared error, RMSE) surface. These problems, which are caused by the extreme (worst-case) errors, can be solved by a different sample selection strategy. A sample selection strategy has been proposed, which provides lower maximal errors and a higher confidence level on the expense of slightly increased RMSE. Applications are presented in the field of spectroscopic ellipsometry (SE), a sensitive, non-destructive but indirect analytical technique. Demonstrative example shows feature common to simulated annealing in the sense of escaping local minima.