Abstract

Poly [2-methoxy, 5-(2¢-ethyl-hexyloxy)-p-phenylene-vinylene] (MEH-PPV) is a well known hole-conducting semiconductor utilized in the fabrication of optoelectronic devices because of its interesting electroluminescence. However, both electroluminescence and electrical conduction in this material sharply deteriorate upon exposure to oxygen, necessitating fabrication and hermetic sealing of the MEH-PPV-based devices in oxygen-free environments. Same shortcoming has excluded the material from applications requiring air exposure. We have recently presented a model for the oxidation mechanism of an MEH-PPV layer and have shown that such layers, after oxidation at certain conditions, can support air-stable electrical conduction. Here, we describe the experimental conditions required for the preparation of an oxidized MEHPPV layer, and provide experimental data on the stability of such layers at different conditions. It is shown that the fabricated air-stable oxidized MEH-PPV layers are excellent for a number of chemical sensor applications.

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