Abstract

The evaluation of photovoltaic device performance is based on the I-V characteristic curve. Unfortunately, the data sheets provided by the manufacturers only include data at standard test conditions, which requires the construction of a model capable of simulating the electrical behavior of these devices at different conditions. The identification of the model from the I-V curve is a challenging task due to the strong nonlinear relationship between the model parameters. This paper proposes a hybrid analytical/iterative method to extract the parameters of the single diode model. In this method, the four parametersa, Rsh, Io and Ipv are calculated directly by their explicit expressions. The properties of the Lambert function are still used to untie the coupling between the parameters. The parameter Rs is determined using an iterative process based on the minimization of the error between the theoretical and experimental data. Accuracy criteria have been introduced to demonstrate the reliability of the proposed method and its accuracy compared to other methods in the literature. The robustness of the proposed mathematical model in the face of variations in the initial conditions chosen has also been demonstrated.

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