Abstract
In this paper, we propose a design method for directional selection in the two-dimensional complex wavelet packet transform (2D-CWPT). Current two-dimensional complex discrete wavelet transforms (2D-CDWT) can extract directional components from images, but the number of directions is small, and the directions and resolutions are fixed. Thus the current 2D-CDWTs are not flexible enough. In this study, we propose a new design method of the directional filters that can detect desirable direction components. Additionally flexible directional selection is achieved because the directional filters are added to the 2D-CWPT. Finally, the proposed method is applied to defect detection in semiconductor wafer circuits and an encouraging result is obtained.
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