Abstract
Multiple ionization of the SiF 4 molecule has been studied using synchrotron radiation and time-of-flight mass spectrometry in a multi-coincidence mode, in the photon energy range of 70–109.4 eV, which encompasses the Si 2p edge. Photoionization branching ratios have been measured under efficient ion extraction and the results are compared to previously published data. Two electron–ion coincidence techniques (PE2PICO, and PE3PICO) have been used in the elucidation of the fragmentation mechanisms of highly excited molecular ions, formed following the absorption of a high-energy photon. It is shown that the unstable doubly charged parent molecule, SiF 4 2+, fragments preferentially (90%) via the asymetric mechanism m 2+→ m 1 2++ m 2.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
