Abstract
The extraction efficiency f for the photoelectrons emitted from a CsI photocathode into gaseous Xe–CH4 and Ne–CH4 mixtures is investigated by Monte Carlo simulation. The results are compared with earlier calculations in Ar–CH4 mixtures and in the pure gases Xe, Ar, Ne and CH4. The calculations examine the dependence of f on the density-reduced electric field E/N in the 0.1–40 Td range, on the incident photon energy Eph in the 6.8–9.8 eV (183–127 nm) VUV range and on the mixture composition. Results calculated for irradiation of the photocathode with a Hg(Ar) lamp are compared with experimental measurements for this lamp. To test the electron scattering cross-sections used in the simulations, electron drift parameters in Xe, Ne and their mixtures with CH4 are also presented and compared with available experimental data.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
