Abstract
The attenuated-total-reflection method (ATR) is used to measure the dielectric constant of a thin layer in a prism-metal-dielectric-air system. The addition of the dielectric layer on the metal produces a shift in the dispersion curve and a change in the intensity of the ATR signals compared with the results for the three-layer prism-metal-air system. Both the shift of the dispersion curve and the intensity ratio are found to be linear functions of the thickness of the added layer. The ATR method, therefore, is considered to be a simple and accurate measuring technique of the dielectric functions.
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