Abstract
Developing test programs for taking measurements on different test systems is still a common procedure within the IC verification process. The complexity of a test program is strongly related to the complexity of ICs and test systems. These test programs usually are non-modular and maintenance is time-consuming. Test programs based on ATML standard [1] have to perform special tasks like parsing XML (Extensible Markup Language) documents, resource allocation, resource mapping, etc. On the other hand, these prerequisites increase modularity and flexibility of the test program. This paper introduces a knowledge-based test program following the ATML standard implemented within LabVIEW [2]. The developed test program can be used for any test system. This helps saving time considering programming effort and improving the verification process.
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