Abstract
Repeated exposure of mass cultures of L strain mouse cells to high doses of ionizing radiation resulted in new strains which had an increased resistance to X-rays. After a cumulative dose of 5000 r spread over five months (80–90 cell generations), growth of these cell lines following a test exposure to 2000 r was compared with that of cultures of the control strain. After the test exposure, growth of the pre-irradiated lines was resumed much sooner than in the controls. The resistant cell lines all had a lower average chromosome number with a wider spread of numbers than had the parental control line.
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