Abstract
Abstract The film badge is today the most widely used personnel monitoring device for want of a more reliable and accurate system. Recent evaluations of the performance of the available commercial film badge services report a wide variation in both the accuracy and consistency of the reported exposures. The best accuracy that one can obtain for X- and gamma-radiation appears to be –50 to +200%. This paper reports the feasibility of using the thermoluminescence of single crystals of LiF (TLD-100) ‡ to measure exposure levels of X- and gamma-radiation encountered in the personnel dosimetry range. The use of single crystals greatly reduces the contribution of the non-radiation induced thermoluminescence. The variation in response of individual crystals was taken into account by calibration of the crystal in place at the time of read-out. LiF single crystals in lucite capsules were attached to film badge holders and given known test exposures from X- and gamma-ray sources and mixtures of these radiations. The performance of the TLD system is compared with the measured values reported by the film badge suppliers. No correction was made for the slight energy dependence of LiF at the low keV exposures. The over-all accuracy of the TLD system is about ± 30% for X- and gamma-ray energies above 25 keV effective.
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