Abstract
We present a Verilog-A based compact model for the superconductor-insulator-superconductor (SIS) Josephson junction. The model can generate both hysteretic and non-hysteretic current-voltage ( I-V ) response for the SIS junctions utilizing the Stewart-McCumber parameter. We calibrate our model with different SIS samples and demonstrate accurate matching between the simulated and experimental results. We implement temperature effect on the energy gap and the critical current of the superconductor to explore the dynamic trends in device characteristics. We calculate the junction inductance and energy as functions of junction current and temperature. We simulate the read/write operations of an SIS junction based cryogenic memory cell to illustrate the usability of our model.
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