Abstract
This letter proposed a combined susceptibility diagram, applicable to investigating and differentiating the inherent mechanism of multipactor in dielectric-loaded microwave devices. This susceptibility diagram consists of average secondary emission yield on the dielectric surface and both the surfaces. Using this diagram, we predict the electron multiplication mechanism in the partially dielectric-loaded parallel-plate waveguide. It is found that the multipactor extinguishing only occurs for a low multipaction rate, while the saturation occurs for a higher multipaction rate. To verify its validity, the dynamic evolution of multipactor is investigated by electrostatic particle-in-cell. A good agreement between simulations and prediction results has been achieved. This susceptibility diagram thus constructed can provide a guidance to clearly identify the condition for multipactor extinguishing or saturation.
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